Product Introduction
This instrument is used to test high‑temperature expansion properties of solid inorganic materials and metallic materials, especially inorganic materials and metal products such as corundum, refractory materials, investment‑casting shell and core materials, ceramics, ceramic raw materials, ceramic slip, glaze, glass, graphite and carbon materials. It provides essential testing means for scientific research and teaching. The instrument can measure linear dimensional change, linear expansion coefficient, volumetric expansion coefficient, thermal‑shock expansion, softening temperature, sintering kinetic study, glass transition temperature, phase transition, density change, Rate‑Controlled Sintering (RCS) and their variation curves. Atmosphere protection for specimens is available upon user requirement; vacuum pumping is supported with vacuum degree of 0.1 MPa.
Technical Parameters
- Maximum furnace temperature: 1200 ℃, 1400 ℃, 1700 ℃
- Heating rate: 0‑100 ℃/min adjustable, computer‑program temperature control
- The computer automatically calculates linear expansion coefficient, volumetric expansion coefficient, linear expansion value and thermal‑shock expansion
- Automatic calculation and compensation of compensation coefficient; manual on‑line correction is available
- Automatic data recording, storage and printing; print temperature‑expansion coefficient curve. Freely‑set temperature interval with minimum interval of 1 ℃
- Deformation measurement adopts high‑precision grating micrometric sensor, measuring range: ±12.7 mm
- Expansion value resolution: 0.1 μm, accuracy: 0.2 μm, automatic range calibration
- Thermal expansion coefficient resolution: 0.001×10⁻⁶/℃, system measurement error: ±0.1%
- Specimen dimension: (2‑15)×(2‑15)×(20‑150) mm, square or round specimens are acceptable
- Imported linear bearing transmission realizes friction‑free transmission of expansion value with excellent transmission accuracy and repeatability
- Power supply: 220 V±10%, 2 kW
- Expansion deformation detection consists of high‑precision grating micrometric sensor and data processing system
