Thermal Conductivity Tester

Product Introduction

This thermal conductivity tester adopts the transient plane source method based on TPS transient plane source technology. It applies Hot‑Disk probe, special high‑precision unit instrument for test and communication, and high‑speed computer data‑processing technology to realize rapid data acquisition from the probe. Accurate and reliable test results can be quickly calculated via sophisticated mathematical models. Professional instrument ensures high overall reliability, convenient operation and easy maintenance.

Technical Parameters

1. Thermal conductivity measuring range: 0.005~100 W/(m·K), resolution: 0.005 W/(m·K)
2. Thermal diffusivity range: 0.1~100 m²/s
3. Thermal effusivity range: 0.1~30 W/(m²·K)
4. Specific heat capacity range: 0.1~5 kJ/(kg·℃)
5. Thermal resistance range: 0.5~0.000005 mm²·K/W
6. Temperature‑measurement accuracy: ≤0.001 ℃
7. Relative measurement error: ≤3%
8. Repeatability error: ≤3%
9. Test duration: 1‑120 seconds
10. Specimen test temperature range: ‑40~130 ℃
11. Probe configuration: Standard‑equipped probe diameter Φ15 mm
12. Fully‑automatic test software realizes fast and accurate parameter analysis and report output for specimen test process
13. Power supply: AC220V±10%, 50/60Hz, total power consumption: ＜500 W

Reference Standard: ISO 22007‑2‑2008